Línu- og yfirborðsmælikerfiChotest
SJ5760
Línu- og yfirborðsmælikerfi
Chotest
SJ5760
EXW föst verð aukaskattur bætist við
18.900 EUR
framleiðsluár
2024
Ástand
sýningavél
Staðsetning
Leonberg 

Myndir sýna
Sýna kort
Upplýsingar um vélina
- Heiti vélar:
- Línu- og yfirborðsmælikerfi
- Framleiðandi:
- Chotest
- Gerð:
- SJ5760
- Framleiðsluár:
- 2024
- Ástand:
- næstum eins og ný (sýningavél)
- Vinnustundir:
- 15 h
Verð og staðsetning
EXW föst verð aukaskattur bætist við
18.900 EUR
- Staðsetning:
- Mühlstraße 41, 71229 Leonberg, Deutschland

Hringdu
Tilboðsupplýsingar
- Auglýsingarauðkenni:
- A20678575
- Uppfærsla:
- síðast þann 04.12.2025
Lýsing
Precise Profile Measuring Instrument | Excellent Condition | Ready for Immediate Use
For sale is a Chotest SJ-5760P, a high-precision contour measuring instrument designed for geometric profile analysis in quality management, toolmaking, mechanical engineering, and research. This unit provides accurate measurements with extended travel ranges and features a stable granite base for reliable results.
—
Condition
• Pre-owned, technically inspected
• Fully operational
• Very well maintained
—
Technical Highlights – Chotest SJ-5760P
Travel Ranges
• X-axis: 0–200 mm
• Z-axis: 0–450 mm
• Device dimensions: 800 × 450 × 1100 mm
• Weight: 220 kg
—
Profile Measurement (SJ-5760P)
• Measuring range Z1: ±25 mm
• Resolution: 0.001 µm
Csdpfx Aex Db Stodpjaa
• Measurement direction: Top / Down
• Measuring speed: 0.05–5 mm/s
• Positioning speed: X/Z up to 20 mm/s
• Measuring force: 10–150 mN, adjustable
• Guideway deviation: ≤1 µm / 200 mm
Accuracy
• X-axis indication error: ±(0.5 + 0.015L) µm
• Z1-axis indication error: ±(0.5 + 0.05H) µm
• Distance: ±(0.8 + 0.02L) µm
• Radius: ≤(1 + R/15) µm
• Angle: ≤±45’’
—
Key Features
• Ideal for precise contour and profile measurements
• Extremely high vertical resolution (0.001 µm)
• Very stable granite base for low-vibration operation
• Large travel ranges for diverse component geometries
• User-friendly and reliable measuring technology
• Suitable for micron-accurate form measurement in both laboratory and production environments
Þessi auglýsing var sjálfvirkt þýdd. Villa í þýðingu gæti verið til staðar.
For sale is a Chotest SJ-5760P, a high-precision contour measuring instrument designed for geometric profile analysis in quality management, toolmaking, mechanical engineering, and research. This unit provides accurate measurements with extended travel ranges and features a stable granite base for reliable results.
—
Condition
• Pre-owned, technically inspected
• Fully operational
• Very well maintained
—
Technical Highlights – Chotest SJ-5760P
Travel Ranges
• X-axis: 0–200 mm
• Z-axis: 0–450 mm
• Device dimensions: 800 × 450 × 1100 mm
• Weight: 220 kg
—
Profile Measurement (SJ-5760P)
• Measuring range Z1: ±25 mm
• Resolution: 0.001 µm
Csdpfx Aex Db Stodpjaa
• Measurement direction: Top / Down
• Measuring speed: 0.05–5 mm/s
• Positioning speed: X/Z up to 20 mm/s
• Measuring force: 10–150 mN, adjustable
• Guideway deviation: ≤1 µm / 200 mm
Accuracy
• X-axis indication error: ±(0.5 + 0.015L) µm
• Z1-axis indication error: ±(0.5 + 0.05H) µm
• Distance: ±(0.8 + 0.02L) µm
• Radius: ≤(1 + R/15) µm
• Angle: ≤±45’’
—
Key Features
• Ideal for precise contour and profile measurements
• Extremely high vertical resolution (0.001 µm)
• Very stable granite base for low-vibration operation
• Large travel ranges for diverse component geometries
• User-friendly and reliable measuring technology
• Suitable for micron-accurate form measurement in both laboratory and production environments
Þessi auglýsing var sjálfvirkt þýdd. Villa í þýðingu gæti verið til staðar.
Bjóðandi
Athugasemd: Skráðu þig ókeypis eða skráðu þig inn, til að fá aðgang að öllum upplýsingum.
Skráð frá: 2023
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